Atomic Resolution Analytical Electron Microscope

JEM-ARM200F is an Atomic Resolution Analytical Electron Microscope, which boasts the world's highest level STEM-HAADF resolution of 78 pm with a STEM Cs corrector incorporated as standard. The JEM-ARM200F, with a STEM Cs corrector incorporated as standard, and the mechanical and electrical stability enhanced to the utmost limit, achieves the world's highest level STEM-HAADF resolution of 78 pm*1 and 82 pm *2. And as the Cs-corrected electron probe has a dramatically increased current density, which is one order larger than conventional FE TEMs, the elemental analysis at the atomic-level becomes possible, along with an extremely enhanced throughput. *1 : with Cold FEG, *2 : with Schottky FEG